An Analytical Model Including Interface Traps and Temperature Effects in Negative Capacitance Double Gate Field Effect Transistor
Dong, Yibiao, Han, Ru, Wang, Danghui, Wang, Ruofei, Guo, ChenmengJournal:
Silicon
DOI:
10.1007/s12633-020-00643-7
Date:
August, 2020
File:
PDF, 2.11 MB
2020