Quantifying the Transverse-Electric-Dominant 260 nm...

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Quantifying the Transverse-Electric-Dominant 260 nm Emission from Molecular Beam Epitaxy-Grown GaN-Quantum-Disks Embedded in AlN Nanowires: A Comprehensive Optical and Morphological Characterization

Subedi, Ram Chandra, Min, Jung-Wook, Mitra, Somak, Li, Kuang-Hui, Ajia, Idris, Stegenburgs, Edgars, Anjum, Dalaver H., Conroy, Michele, Moore, Kalani, Bangert, Ursel, Roqan, Iman S., Ng, Tien Khee, Oo
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Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.0c03259
Date:
September, 2020
File:
PDF, 3.17 MB
2020
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