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[IEEE 2020 IEEE Aerospace Conference - Big Sky, MT, USA (2020.3.7-2020.3.14)] 2020 IEEE Aerospace Conference - The Dual-Rasp Sampling System for an Enceladus Lander
Backes, Paul, Moreland, Scott, Badescu, Mircea, Riccobono, Dario, Brinkman, Alex, Choukroun, Mathieu, Molaro, Jamie, Aggerwal, Rajan, Newbold, Timothy, Ahmad, Adeel, Ubellacker, SamuelYear:
2020
DOI:
10.1109/AERO47225.2020.9172462
File:
PDF, 3.17 MB
2020