Atomic layer epitaxy of InAs with high silicon doping concentration
Cohen Elias, Doron, Cohen, Guy M., Memram, David, Saad, Shmuel, Bloom, Arnold, Shusterman, Sergey Shay, Katz, Moti, Hopstaken, Marinus, Saccomanno, Michael, Spratt, Will, Lee, Sanghoon, Lavoie, ChristVolume:
38
Journal:
Journal of Vacuum Science & Technology A
DOI:
10.1116/6.0000339
Date:
September, 2020
File:
PDF, 1.79 MB
2020