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Extrinsic Absorption Pathways in VanadiumâDoped SiC Measured Using a Total Internal Reflection Geometry
Kramer, Noah J., Voss, Lars F., Conway, Adam M., Grivickas, Paulius V., Bora, Mihail, Hall, David L., Caruso, Anthony N.Journal:
physica status solidi (a)
DOI:
10.1002/pssa.202000315
Date:
August, 2020
File:
PDF, 677 KB
2020