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[IEEE 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Vienna, Austria (2020.9.13-2020.9.18)] 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Experimental Investigation on the Electrical Properties of SOI-LIGBT Under Total-Ionizing-Dose Radiation
Yang, Guangan, Wu, Wangran, Tang, Pengyu, Yang, Jing, Liu, Siyang, Zhang, Long, Sun, Weifeng, Zhang, XingyaoYear:
2020
DOI:
10.1109/ISPSD46842.2020.9170168
File:
PDF, 723 KB
2020