Quasi-Normally-Off AlGaN/GaN HEMTs with SiNx Stress Liner and Comb Gate for Power Electronics Applications
Cheng, Wei-Chih, Zeng, Fanming, He, Minghao, Wang, Qing, Chan, Mansun, Yu, HongyuYear:
2020
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2020.3020186
File:
PDF, 1005 KB
2020