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[IEEE 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE) - Delft, Netherlands (2020.6.17-2020.6.19)] 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE) - Geometric analysis of a laser scanner functioning based on dynamic triangulation
Sepulveda-Valdez, Cesar, Sergiyenko, Oleg, Tyrsa, Vera, Flores-Fuentes, Wendy, Rodriguez-Quinonez, Julio Cesar, Murrienta-Rico, Fabian Natanael, Miranda-Vega, Jesus Elias, Miranda-Vega, Jesus Elias, MYear:
2020
DOI:
10.1109/ISIE45063.2020.9152268
File:
PDF, 1.65 MB
2020