Highly Scalable and Robust Mesa‐Island‐Structure...

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Highly Scalable and Robust Mesa‐Island‐Structure Metal‐Oxide Thin‐Film Transistors and Integrated Circuits Enabled by Stress‐Diffusive Manipulation

Kim, Kyung‐Tae, Moon, Sanghee, Kim, Minho, Jo, Jeong‐Wan, Park, Chan‐Yong, Kang, Seung‐Han, Kim, Yong‐Hoon, Park, Sung Kyu
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Journal:
Advanced Materials
DOI:
10.1002/adma.202003276
Date:
September, 2020
File:
PDF, 2.59 MB
2020
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