X-ray characterization of self-standing bent Si crystal...

Journal of Applied Crystallography 2020 / 04 Vol. 53; Iss. 2

X-ray characterization of self-standing bent Si crystal plates for Large Hadron Collider beam extraction

Camattari, Riccardo, Romagnoni, Marco, Bandiera, Laura, Bagli, Enrico, Mazzolari, Andrea, Sytov, Alexei, Haaga, Simon, Kabukcuoglu, Merve, Bode, Simon, Hänschke, Daniel, Danilewsky, Andreas, Baumbach
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Volume:
53
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576720002800
Date:
April, 2020
File:
PDF, 1.27 MB
2020
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