Joint Modeling of Degradation and Lifetime Data for RUL...

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IEEE Transactions on Industrial Informatics 2020

Joint Modeling of Degradation and Lifetime Data for RUL Prediction of Deteriorating Products

Hu, Jiawen, Sun, Qiuzhuang, Ye, Zhi-Sheng, Zhou, Qiang
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Year:
2020
Journal:
IEEE Transactions on Industrial Informatics
DOI:
10.1109/TII.2020.3021054
File:
PDF, 2.65 MB
2020
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