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[IEEE 2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Cracow, Poland (2020.7.5-2020.7.8)] 2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Simulation of Fatigue Damage in Clusters of DMOS Cells Subjected to Non-Uniform Transient Thermo-Mechnical Loading
Hoffmann, Paul, Nelhiebel, Michael, Karunamurthy, Balamurugan, Pettermann, Heinz E., Todt, MelanieYear:
2020
DOI:
10.1109/EuroSimE48426.2020.9152728
File:
PDF, 541 KB
2020