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[IEEE 2020 IEEE International Conference on Prognostics and Health Management (ICPHM) - Detroit, MI, USA (2020.6.8-2020.6.10)] 2020 IEEE International Conference on Prognostics and Health Management (ICPHM) - Defects Tracking via NDE Based Transfer Learning
Mukherjee, Subrata, Huang, Xuhui, Rathod, Vivek T., Udpa, Lalita, Deng, YimingYear:
2020
DOI:
10.1109/ICPHM49022.2020.9187034
File:
PDF, 1.50 MB
2020