Histogram Measurement of ADC Nonlinearities by Using...

Russian Microelectronics 2019 / 12 Vol. 48; Iss. 7

Histogram Measurement of ADC Nonlinearities by Using Incomplete-Scale Sine Waves

Rybakov, A. A., Reznichenko, N. E.
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Volume:
48
Journal:
Russian Microelectronics
DOI:
10.1134/S1063739719070138
Date:
December, 2019
File:
PDF, 651 KB
2019
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