Evaluation of portosystemic shunt caused by patent ductus...

Evaluation of portosystemic shunt caused by patent ductus venosus through sequential whole-body scanning using per-sigmoid colon123I-IMP scintigraphy

Tomohiro Kaneta, Motoshi Wada, Kentaro Takanami, Tomohiro Ishii, Setsu Matsumoto, Ken Okada, Hiroshi Fukuda, Shogo Yamada, Shoki Takahashi
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Volume:
21
Language:
english
Pages:
5
DOI:
10.1007/s12149-007-0072-5
Date:
December, 2007
File:
PDF, 270 KB
english, 2007
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