![](/img/cover-not-exists.png)
[IEEE 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Reno, NV, USA (2020.7.28-2020.8.28)] 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Effect of RF Signals on TVS Diode Trigger Voltage for ESD Protection
Maghlakelidze, Giorgi, Marathe, Shubhankar, Huang, Wei, Willemen, Joost, Pommerenke, DavidYear:
2020
DOI:
10.1109/EMCSI38923.2020.9191542
File:
PDF, 1.75 MB
2020