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[IEEE 2020 Annual Reliability and Maintainability Symposium (RAMS) - Palm Springs, CA, USA (2020.1.27-2020.1.30)] 2020 Annual Reliability and Maintainability Symposium (RAMS) - Exact Confidence Intervals for the Hazard Rate of a Series Reliability System
Plum, Patrick, Lewitschnig, Horst, Pilz, JurgenYear:
2020
DOI:
10.1109/RAMS48030.2020.9153656
File:
PDF, 145 KB
2020