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[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Towards Secure Composition of Integrated Circuits and Electronic Systems: On the Role of EDA
Knechtel, Johann, Kavun, Elif Bilge, Regazzoni, Francesco, Heuser, Annelie, Chattopadhyay, Anupam, Mukhopadhyay, Debdeep, Dey, Soumyajit, Fei, Yunsi, Belenky, Yaacov, Levi, Itamar, Guneysu, Tim, SchauYear:
2020
DOI:
10.23919/date48585.2020.9116483
File:
PDF, 698 KB
2020