[IEEE 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020) - Denver (Aurora), CO, USA (2020.8.24-2020.8.28)] 2020 Conference on Precision Electromagnetic Measurements (CPEM) - Defect Detection and Identification of Point-Focusing Shear-Horizontal EMAT for Plate Inspection
Peng, Lisha, Sun, Hongyu, Wang, Shen, Wang, Qing, Zhao, Wei, Huang, SonglingYear:
2020
DOI:
10.1109/CPEM49742.2020.9191716
File:
PDF, 371 KB
2020