Fast Pixelated Detectors in Scanning Transmission Electron...

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Microscopy and Microanalysis 2020 / 09

Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization

Paterson, Gary W., Webster, Robert W. H., Ross, Andrew, Paton, Kirsty A., Macgregor, Thomas A., McGrouther, Damien, MacLaren, Ian, Nord, Magnus
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Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927620024307
Date:
September, 2020
File:
PDF, 1.54 MB
2020
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