[IEEE 2020 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Noida, India (2020.6.4-2020.6.5)] 2020 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Survey on Fake Profile Detection on Social Sites by Using Machine Learning Algorithm
Patel, Kumud, Agrahari, Sudhanshu, Srivastava, SaijshreeYear:
2020
DOI:
10.1109/ICRITO48877.2020.9197935
File:
PDF, 219 KB
2020