A Dynamic-Key Based Secure Scan Architecture for...

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A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing

Lee, Kuen-Jong, Liu, Ching-An, Wu, Chia-Chi
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Year:
2020
Journal:
IEEE Transactions on Emerging Topics in Computing
DOI:
10.1109/TETC.2020.3021820
File:
PDF, 631 KB
2020
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