[IEEE 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2020.8.10-2020.8.13)] 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - A 12-bit 100-kS/s SAR ADC for IoT Applications
Chung, Yung-Hui, Zeng, Qi-FengYear:
2020
DOI:
10.1109/VLSI-DAT49148.2020.9196440
File:
PDF, 663 KB
2020