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[IEEE 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2020.8.10-2020.8.13)] 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Resistor-Based Temperature Sensing Chip with Digital Output
Chang, Kai-Min, Lin, Yen-Ju, Wei, Chia-Liang, Chang, Soon-JyhYear:
2020
DOI:
10.1109/VLSI-DAT49148.2020.9196448
File:
PDF, 697 KB
2020