Effect of test patterns on measurement of the luminance of...

Radiological Physics and Technology 2008 / 01 Vol. 1; Iss. 1

Effect of test patterns on measurement of the luminance of LCD devices by use of a telescopic-type luminance meter

Junji Morishita, Kiyoshi Dogomori, Shiro Hatanaka, Takeshi Hiwasa, Yasuhiko Nakamura, Noriyuki Hashimoto, Yoshiharu Higashida, Fukai Toyofuku, Masafumi Ohki
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Volume:
1
Language:
english
Pages:
5
DOI:
10.1007/s12194-007-0011-0
Date:
January, 2008
File:
PDF, 249 KB
english, 2008
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