Characterization of Hole Traps Generated by Electron...

Characterization of Hole Traps Generated by Electron Injection in Thin SiO 2 Films

Brożek, Tomasz, Lum, Eric B., Viswanathan, Chand R.
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Volume:
473
Year:
1997
Journal:
MRS Proceedings
DOI:
10.1557/PROC-473-203
File:
PDF, 912 KB
1997
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