Characterization of Hole Traps Generated by Electron Injection in Thin SiO 2 Films
Brożek, Tomasz, Lum, Eric B., Viswanathan, Chand R.Volume:
473
Year:
1997
Journal:
MRS Proceedings
DOI:
10.1557/PROC-473-203
File:
PDF, 912 KB
1997