Aging Estimation of MOS FETs...

Aging Estimation of MOS FETs Using Aging‐Tolerant /Aged Ring Oscillators

Miura, Yukiya, Ikeda, Tatsunori
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Journal:
IEEJ Transactions on Electrical and Electronic Engineering
DOI:
10.1002/tee.23218
Date:
September, 2020
File:
PDF, 401 KB
2020
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