[IEEE 2019 5th International Conference on Science and...

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[IEEE 2019 5th International Conference on Science and Technology (ICST) - Yogyakarta, Indonesia (2019.7.30-2019.7.31)] 2019 5th International Conference on Science and Technology (ICST) - Software Defect Prediction Using Software Metrics with Naïve Bayes and Rule Mining Association Methods

Tua, Fernando Maruli, Danar Sunindyo, Wikan
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Year:
2019
DOI:
10.1109/ICST47872.2019.9166448
File:
PDF, 390 KB
2019
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