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On the Dependence of Band Alignment of SiOâ/Si Stack on SiOâ Thickness: Extrinsic Or Intrinsic?
Xu, Yonggui, Han, Kai, Xiang, Jinjuan, Wang, XiaoleiVolume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/access.2020.3020072
File:
PDF, 1.10 MB
2020