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[IEEE 2019 International Conference on Sensing, Diagnostics, Prognostics, and Control (SDPC) - Beijing, China (2019.8.15-2019.8.17)] 2019 International Conference on Sensing, Diagnostics, Prognostics, and Control (SDPC) - Research on Fault Diagnosis of Neural Network Based on Bee Colony Algorithm Optimization in Gun Control System
Li, Yingshun, Liu, Yongjian, Yi, XiaojianYear:
2019
DOI:
10.1109/sdpc.2019.00036
File:
PDF, 301 KB
2019