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On the reliability of highly magnified micrographs for structural analysis in materials science
Wortmann, Martin, Layland, Ashley Stephen, Frese, Natalie, Kahmann, Uwe, Grothe, Timo, Storck, Jan Lukas, Blachowicz, Tomasz, Grzybowski, Jacek, Hüsgen, Bruno, Ehrmann, AndreaVolume:
10
Journal:
Scientific Reports
DOI:
10.1038/s41598-020-71682-8
Date:
December, 2020
File:
PDF, 2.85 MB
2020