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Depth-detection methods for microgripper based CNT manipulation in a scanning electron microscope
Volkmar Eichhorn, Sergej Fatikow, Thomas Wich, Christian Dahmen, Torsten Sievers, Karin Nordström Andersen, Kenneth Carlson, Peter BøggildVolume:
4
Language:
english
Pages:
10
DOI:
10.1007/s12213-008-0001-2
Date:
November, 2008
File:
PDF, 440 KB
english, 2008