Analytical modelling and verification of potential profile...

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International Journal of Electronics 2020 / 09

Analytical modelling and verification of potential profile of DG JLFET with and without stack oxide

Haque, Md. Mahfuzul, Kabir, Md. Humaun, Adnan, Md. Mohsinur Rahman
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Journal:
International Journal of Electronics
DOI:
10.1080/00207217.2020.1818842
Date:
September, 2020
File:
PDF, 3.41 MB
2020
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