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[IEEE 2020 Annual Reliability and Maintainability Symposium (RAMS) - Palm Springs, CA, USA (2020.1.27-2020.1.30)] 2020 Annual Reliability and Maintainability Symposium (RAMS) - Combining Hazards into a Single-Top Fault Tree
Weglian, John, Riley, Jeff, Ferrante, FernandoYear:
2020
DOI:
10.1109/RAMS48030.2020.9153625
File:
PDF, 137 KB
2020