[IEEE 2020 Annual Reliability and Maintainability Symposium (RAMS) - Palm Springs, CA, USA (2020.1.27-2020.1.30)] 2020 Annual Reliability and Maintainability Symposium (RAMS) - A Multivariate Correlation Degradation Model for Reliability Analysis Based on Copula
Chen, Wen, Zhao, GuangyanYear:
2020
DOI:
10.1109/RAMS48030.2020.9153635
File:
PDF, 150 KB
2020