Fine-Grained Defect Diagnosis for CMOL FPGA Circuits

IEEE Access 2020 Vol. 8

Fine-Grained Defect Diagnosis for CMOL FPGA Circuits

Kim, Jihye, Lee, Hayoung, Jang, Seokjun, Kang, Sungho
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Volume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/access.2020.3022027
File:
PDF, 2.83 MB
2020
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