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[IEEE 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) - Oxford, United Kingdom (2020.8.3-2020.8.6)] 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) - Dealing with Robustness of Convolutional Neural Networks for Image Classification
Arcaini, Paolo, Bombarda, Andrea, Bonfanti, Silvia, Gargantini, AngeloYear:
2020
DOI:
10.1109/aitest49225.2020.00009
File:
PDF, 865 KB
2020