Application of electrostatic force microscopy on characterizing an electret fiber: Effect of tip to specimen distance on phase shift
J. Kim, J. P. Hinestroza, W. Jasper, R. L. BarkerVolume:
12
Language:
english
Pages:
6
DOI:
10.1007/s12221-011-0089-1
Date:
February, 2011
File:
PDF, 522 KB
english, 2011