Using Fourier-Plane Imaging Microscopy for Determining...

Physical Review Applied 2020 / 9 Vol. 14; Iss. 3

Using Fourier-Plane Imaging Microscopy for Determining Transition-Dipole-Moment Orientations in Organic Light-Emitting Devices

Kim, Jongchan, Zhao, Haonan, Hou, Shaocong, Khatoniar, Mandeep, Menon, Vinod, Forrest, Stephen R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
14
Journal:
Physical Review Applied
DOI:
10.1103/PhysRevApplied.14.034048
Date:
September, 2020
File:
PDF, 3.13 MB
2020
Conversion to is in progress
Conversion to is failed