[IEEE 2020 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Suzhou, China (2020.7.29-2020.7.31)] 2020 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Application of Radar Cross Section to Far-field Damage Detection
Shang, Yingxue, Li, Songyang, He, Xiaoxiang, Yang, YangYear:
2020
DOI:
10.1109/IMWS-AMP49156.2020.9199712
File:
PDF, 488 KB
2020