[IEEE 2020 IEEE International Conference On Artificial...

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[IEEE 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) - Oxford, United Kingdom (2020.8.3-2020.8.6)] 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) - Building a Classification System for Failed Test Reports: Industrial Experience

Pavlov, Sergey, Gromova, Anna, Itkin, Iosif, Mamedov, Murad, Libkov, Alexander, Novikov, Andrey, Tsymbalov, Evgenii
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Year:
2020
DOI:
10.1109/aitest49225.2020.00021
File:
PDF, 682 KB
2020
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