How Photoinduced Gate Screening and Leakage Currents...

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physica status solidi (RRL) - Rapid Research Letters 2020 / 07

How Photoinduced Gate Screening and Leakage Currents Dynamically Change the Fermi Level in 2D Materials

Volmer, Frank, Ersfeld, Manfred, Rathmann, Lars, Heithoff, Maximilian, Kotewitz, Luca, Lohmann, Mark, Yang, Bowen, Watanabe, Kenji, Taniguchi, Takashi, Bartels, Ludwig, Shi, Jing, Stampfer, Christoph,
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Journal:
physica status solidi (RRL) – Rapid Research Letters
DOI:
10.1002/pssr.202000298
Date:
July, 2020
File:
PDF, 767 KB
2020
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