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Analysis of elemental composition of Fe 1âx Ni x and Si 1âx Ge x alloy thin films by electron probe microanalysis and microâfocus Xâray fluorescence
Hodoroaba, VasileâDan, Terborg, Ralf, Boehm, Stephan, Kim, Kyung JoongJournal:
Surface and Interface Analysis
DOI:
10.1002/sia.6834
Date:
June, 2020
File:
PDF, 1.11 MB
2020