Analysis of elemental composition of Fe...

Analysis of elemental composition of Fe 1‐x Ni x and Si 1‐x Ge x alloy thin films by electron probe microanalysis and micro‐focus X‐ray fluorescence

Hodoroaba, Vasile‐Dan, Terborg, Ralf, Boehm, Stephan, Kim, Kyung Joong
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Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6834
Date:
June, 2020
File:
PDF, 1.11 MB
2020
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