TCAD-Machine Learning Framework for Device Variation and...

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IEEE Journal of the Electron Devices Society 2020

TCAD-Machine Learning Framework for Device Variation and Operating Temperature Analysis with Experimental Demonstration

Wong, Hiu Yung, Xiao, Ming, Wang, Boyan, Chiu, Yan Ka, Yan, Xiaodong, Yan, Xiaodong, Ma, Jiahui, Sasaki, Kohei, Wang, Han, Zhang, Yuhao
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Year:
2020
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2020.3024669
File:
PDF, 1.18 MB
2020
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