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[IEEE 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Reno, NV, USA (2020.7.28-2020.8.28)] 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - The Effect of the Parallel-Plate Mode on Striplines in Inhomogeneous Dielectric Media
He, Jiayi, Yong, Shaohui, Kiguradze, Zurab, Chada, Arun, Mutnury, Bhyrav, Drewniak, JamesYear:
2020
DOI:
10.1109/emcsi38923.2020.9191661
File:
PDF, 654 KB
2020