Research and analysis on defect detection of...

E3S Web of Conferences 2020 Vol. 185

Research and analysis on defect detection of semi-conductive layer of high voltage cable

Liu, Sanwei, Zhang, Jun, Xie, Yi, Duan, Jianjia, Huang, Fuyong, Duan, Xiaoli, Zeng, Zeyu, Yang, L., Xu, Z.
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Volume:
185
Year:
2020
Journal:
E3S Web of Conferences
DOI:
10.1051/e3sconf/202018501057
File:
PDF, 286 KB
2020
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