[IEEE 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020) - Denver (Aurora), CO, USA (2020.8.24-2020.8.28)] 2020 Conference on Precision Electromagnetic Measurements (CPEM) - A Characteristic Approximation Approach to Defect Edge Detection in Magnetic Flux Leakage Testing
Long, Yue, Huang, Songling, Peng, Lisha, Wang, Shen, Zhao, WeiYear:
2020
DOI:
10.1109/cpem49742.2020.9191752
File:
PDF, 1.88 MB
2020