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[IEEE 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) - Montréal, QC, Canada (2020.6.16-2020.6.19)] 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) - On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits
Gutierrez, Valentin, Leger, GildasYear:
2020
DOI:
10.1109/newcas49341.2020.9159811
File:
PDF, 1.25 MB
2020