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Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation
Wu, Yi-Da, Yang, Kexin, Hsu, Shu-Han, Milor, LindaYear:
2020
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2020.3017950
File:
PDF, 3.64 MB
2020