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IEEE Transactions on Electron Devices 2020

Device, Circuit, and Reliability Assessment of Drain-Extended FinFETs for Sub-14 nm System on Chip Applications

Kumar, B. Sampath, Ajay,, Paul, Milova, Somayaji, Jhnanesh, Gossner, Harald, Shrivastava, Mayank
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Year:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.3020904
File:
PDF, 2.21 MB
2020
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